The Research Centre for Microtechnology operates a FEI XL30-ESEM FEG scanning electron micro-scope. The equipment is able to generate magnified images of a broad range of samples - electrically conducting or insulating samples, samples containing a high fraction of water and biological samples. It is not necessary to apply a conductive coating to insulating materials to analyze them.
The results provided by the analytical capabilities of this instrument are interpreted by an experienced materials scientist. Elemental analysis and elemental mapping often provide a clue to a causal explanation for defects in components. This instrument and the scientific consulting connected with it are offered as a service to local industry.
Microparts, surface structures, coatings, fractures of all kinds, corrosion and its by-products, inclusions, fibres, preparation of layered materials.