A white light interferometer is an instrument used to analyze the surface topography of light reflecting surfaces. Parameters such as the surface roughness can be extracted from the data. The area of measurement is typically smaller than 1 mm². Since the basis of the method is interferometry with light reflected from the sample, the surface of the sample has to reflect light. The achievable resolution is in the order of a few nanometers.


  • Determination of surface roughness using standard and non-standard parameters
  • Measurement of surface topography

Fields of application

  • Roughness parameters Ra, Rq, Rz, of metal surfaces
  • Surfaces of glass can be analyzed in most cases


VEECO  Wyko NT1100

Kontaktperson aus der Forschung

Heinz Duelli

Prof. (FH) Dipl.-Ing. Dr. Heinz Duelli
Scanning electron microscopy, materials and damage analysis

 +43 5572 792 1008