X-ray fluorescence is a method to identify materials and measure film thicknesses. Once the composition of a layered system is known, film thicknesses can be determined. First the instrument is calibrated to the particular layer system, e.g. Zn on Fe. Then the thickness of the Zn layer on the Fe substrate can be determined to an accuracy of 1 µm within 30 sec. X-ray fluorescence can also be used to determine the chemical composition of alloys. Different types of steel can be distinguished easily.
Fischerscope X-RAY XAN