The JEOL JSM-7100F scanning electron microscope provides microscopic insights into the structure and composition of material surfaces down to the nanometer scale. Example applications are:

  • Surface imaging of both electrically conductive and non-conductive samples
  • Inspection of wet biological and inorganic samples
  • Qualitative elemental analysis from B to Pb
  • Quantitative elemental analysis from Na upwards

Please contact Stefan Arzbacher for aspects concerning accelerated lifetime testing (Lab4ALT) and Stephan Kasemann for more general inquiries concerning the scanning electron microscopy.

Degraded MgMnO sample with x3500 and x350 magnification


  • Magnification x10 to x1000000
  • Elemental detectability  down to 0.5 wt%
  • Maximum sample size (H x W x D): 100 x 100 x 50 mm
  • Traversing range of sample holder: Ø50 mm
  • Z-axis range: 25 mm
  • Maximal SE image resolution: 1.2 nm (30kV), 3.0 nm (1kV)


  • SEM images of samples
  • Fracture analysis requiring depth of focus
  • Elemental analysis, elements with fraction
  • Elemental mapping, local distribution of elements
  • Consulting


Mag. Dr. Stefan Arzbacher
Senior Postdoc mit Leitungsfunktion

+43 5572 792 3803


Dr. Stephan Kasemann
PVD – Beschichtung und Trockenätzen


Services am FZ Energie