Scanning electron microscopy (SEM)

The JEOL JSM-7100F scanning electron microscope provides microscopic insights into the structure and composition of material surfaces down to the nanometer scale. Example applications are:

• Surface imaging of both electrically conductive and non-conductive samples
• Inspection of wet biological and inorganic samples
• Qualitative elemental analysis from B to Pb
• Quantitative elemental analysis from Na upwards

Please contact Stefan Arzbacher for aspects concerning accelerated lifetime testing (Lab4ALT) and Stephan Kasemann for more general inquiries concerning the scanning electron microscopy.

• Magnification x10 to x1000000
• Elemental detectability  down to 0.5 wt%
• Maximum sample size (H x W x D): 100 x 100 x 50 mm
• Traversing range of sample holder: Ø50 mm
• Z-axis range: 25 mm
• Maximal SE image resolution: 1.2 nm (30kV), 3.0 nm (1kV)

• SEM images of samples
• Fracture analysis requiring depth of focus
• Elemental analysis, elements with fraction
• Elemental mapping, local distribution of elements
• Consulting