The JEOL JSM-7100F scanning electron microscope provides microscopic insights into the structure and composition of material surfaces down to the nanometer scale. Example applications are:
Please contact Stefan Arzbacher for aspects concerning accelerated lifetime testing (Lab4ALT) and Stephan Kasemann for more general inquiries concerning the scanning electron microscopy.
Mag. Dr. Stefan Arzbacher
Senior Postdoc mit Leitungsfunktion
+43 5572 792 3803
stefan.arzbacher@fhv.at
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Dr. Stephan Kasemann
PVD – Beschichtung und Trockenätzen
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