The JEOL JSM-7100F scanning electron microscope provides microscopic insights into the structure and composition of material surfaces down to the nanometer scale. Example applications are:

  • Surface imaging of both electrically conductive and non-conductive samples
  • Inspection of wet biological and inorganic samples
  • Qualitative elemental analysis from B to Pb
  • Quantitative elemental analysis from Na upwards
Degraded MgMnO sample with x3500 and x350 magnification


  • Magnification x10 to x1000000
  • Elemental detectability  down to 0.5 wt%
  • Maximum sample size (H x W x D): 100 x 100 x 50 mm
  • Traversing range of sample holder: Ø50 mm
  • Z-axis range: 25 mm
  • Maximal SE image resolution: 1.2 nm (30kV), 3.0 nm (1kV)


  • SEM images of samples
  • Fracture analysis requiring depth of focus
  • Elemental analysis, elements with fraction
  • Elemental mapping, local distribution of elements
  • Consulting


Mag. Dr. Stefan Arzbacher
Senior Postdoc mit Leitungsfunktion

+43 5572 792 3803


Prof. (FH) Dipl-.Ing. Dr. Heinz Duelli
Werkstoffprüfung und Schadensanalyse

+43 5572 792 1008


Services am FZ Energie