The Weiss ShockEvent T/60/V2 is a temperature shock test chamber for the simulation of both extreme and rapidly changing temperatures. Simulations like these are used to study the effect of temperature induced stress on materials and components. The chamber can be operated in single – and double chamber mode enabling both temperature – and temperature shock tests with just one single device.
Mag. Dr. Stefan Arzbacher
Senior Postdoc mit Leitungsfunktion
+43 5572 792 3803
stefan.arzbacher@fhv.at
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